Atomic Force Microscope Facility
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Urbino University has available a scanning probe microscope system for use by the Urbino community. Atomic Force Microscopy (AFM) is a microscopy technique that can measure surface morphology down to atomic resolution. Also nanomechanical properties of samples and single molecule behaviour can be analysed.
For further information, contact :
Michele Menotta
Tel. +39 0722 305232
e-mail: michele.menotta@uniurb.it
Mauro Magnani
e-mail: mauro.magnani@uniurb.it
or visit our web site (click here)